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Xiaorong Qin


Xiaorong QinPresent Research Activities:

Driven by the present trend of device miniaturization and the emerging opportunities of molecular electronics, high-precision measurement on surface properties and atomic-scale manipulation of materials are increasingly required. The research of my group is centered on using scanning tunneling microscopy/spectroscopy (STM/STS), atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) to characterize structural, electronic and optical properties of surfaces and interfaces at atomic / molecular / nanometer scale.


The research activities are twofold:

1) To investigate semiconductor hetero-epitaxy, the aim is to understand the elementary processes during the hetero-growth and the controlled surface/interface quantum feature formation;

2) To investigate organic ultra-thin film growth on silicon-based substrates, and to characterize electron transport and other exceptional properties of the thin films. The aim is to couple existing microelectronics technology with organic-based structures for seeking its potential applications in the next generation of electronic devices.

General area of interest:

• Scanning probe microscopy (STM, AFM and SNOM)

• Nanostructured materials

• Surfaces and Interfaces

• Thin Film Growth



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